• DocumentCode
    3650396
  • Title

    Characterization and modeling of zero bias rf-detection diodes based on triple barrier resonant tunneling structures

  • Author

    Gregor Keller;Anselme Tchegho;Benjamin Münstermann;Werner Prost;Franz-Josef Tegude;Michihiko Suhara

  • Author_Institution
    Center for Semiconductor Technology and Optoelectronics, University of Duisburg Essen, Lotharstr. 55, D-47057, Germany
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    InP-based resonant tunneling diodes with symmetrical I/V-characteristics have shown their excellent high frequency performance for THz signal generation. For signal detection we present a device with an additional third barrier to create an unsymmetrical I/V-characteristic. Sensitivity measurements are performed and further improvements by scaling of the active device area are discussed. To allow SPICE based circuit simulation an approach for a large signal model is presented.
  • Keywords
    "Mathematical model","Sensitivity","Resonant tunneling devices","Semiconductor diodes","Semiconductor device measurement","Voltage measurement","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials (IPRM), 2013 International Conference on
  • ISSN
    1092-8669
  • Print_ISBN
    978-1-4673-6130-9
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2013.6562641
  • Filename
    6562641