DocumentCode
3651109
Title
EMC compliant LIN transceiver
Author
Philipp Schröter;Magnus-Maria Hell;Martin Frey
Author_Institution
Automotive, Infineon Technol., Neubiberg, Germany
fYear
2013
Firstpage
363
Lastpage
366
Abstract
This paper introduces an integrated Local Interconnect Network (LIN) transceiver which sets a new performance benchmark in terms of electromagnetic compatibility (EMC). The proposed topology succeeds in an extraordinary high robustness against RF disturbances which are injected into the BUS and in very low electromagnetic emissions (EMEs) radiated by the LIN network without adding any external components for filtering. In order to evaluate the circuits superior EMC performance, it was designed using a HV-BiCMOS technology for automotive applications, the EMC behavior was measured and the results were compared with a state of the art topology.
Keywords
"Radio frequency","Logic gates","Transceivers","Automotive engineering","Electromagnetics","Immunity testing"
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2013 Proceedings of the
ISSN
1930-8833
Print_ISBN
978-1-4799-0643-7
Type
conf
DOI
10.1109/ESSCIRC.2013.6649148
Filename
6649148
Link To Document