• DocumentCode
    3651730
  • Title

    Memristor measurements and simulations

  • Author

    Milan Fratrik;Stefan Badura;Martin Klimo;Ondrej Skvarek

  • Author_Institution
    Fac. of Manage. Sci. &
  • Volume
    2
  • fYear
    2013
  • Firstpage
    243
  • Lastpage
    246
  • Abstract
    Memristors may find their use in many applications - mainly as memory or logic and also as fuzzy systems or neuromorphic systems. High amount of scientific papers show that the research of memristors draws a lot of attention recently. Memristor models are briefly described in this paper and we present our results obtained from measurements. The goal of our experiments and measurements was to fit the theoretical models with real memristors. In this paper we discuss our achievements and we present deep analysis of described problem.
  • Keywords
    "Mathematical model","Memristors","Current measurement","Voltage measurement","Semiconductor device measurement","Integrated circuit modeling","Equations"
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2013 International
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4673-5670-1
  • Type

    conf

  • DOI
    10.1109/SMICND.2013.6688668
  • Filename
    6688668