Title :
Innovative practices session 11C: Advanced scan methodologies [3 presentations]
Author :
Janusz Rajski;Nilanjan Mukherjee
Author_Institution :
Mentor Graphics, USA
fDate :
4/1/2015 12:00:00 AM
Abstract :
Provides an abstract for each of the presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
DOI :
10.1109/VTS.2015.7116300
