• DocumentCode
    3653904
  • Title

    Innovative practices session 11C: Advanced scan methodologies [3 presentations]

  • Author

    Janusz Rajski;Nilanjan Mukherjee

  • Author_Institution
    Mentor Graphics, USA
  • fYear
    2015
  • fDate
    4/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Provides an abstract for each of the presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116300
  • Filename
    7116300
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3653904