DocumentCode
3655356
Title
Preface
fYear
2015
fDate
6/1/2015 12:00:00 AM
Abstract
Presents the introductory welcome message from the conference proceedings. May include the conference officers´ congratulations to all involved with the conference event and publication of the proceedings record.
Publisher
ieee
Conference_Titel
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Type
conf
DOI
10.1109/ISVDAT.2015.7208157
Filename
7208157
Link To Document