DocumentCode :
3655383
Title :
Testing and reliability
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
519
Lastpage :
519
Abstract :
Start of the above-titled section of the conference proceedings record.
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
Type :
conf
DOI :
10.1109/MIXDES.2015.7208576
Filename :
7208576
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3655383