Title :
Avoiding Pitfalls in Fault-Injection Based Comparison of Program Susceptibility to Soft Errors
Author :
Horst Schirmeier;Christoph Borchert;Olaf Spinczyk
Author_Institution :
Dept. of Comput. Sci. 12, Tech. Univ., Dortmund, Germany
fDate :
6/1/2015 12:00:00 AM
Abstract :
Since the first identification of physical causes for soft errors in memory circuits, fault injection (FI) has grown into a standard methodology to assess the fault resilience of computer systems. A variety of FI techniques trying to mimic these physical causes has been developed to measure and compare program susceptibility to soft errors. In this paper, we analyze the process of evaluating programs, which are hardened by software-based hardware fault-tolerance mechanisms, under a uniformly distributed soft-error model. We identify three pitfalls in FI result interpretation widespread in the literature, even published in renowned conference proceedings. Using a simple machine model and transient single-bit faults in memory, we find counterexamples that reveal the unfitness of common practices in the field, and substantiate our findings with real-world examples. In particular, we demonstrate that the fault coverage metric must be abolished for comparing programs. Instead, we propose to use extrapolated absolute failure counts as a valid comparison metric.
Keywords :
"Benchmark testing","Hardware","Fault tolerance","Fault tolerant systems","Transient analysis","Measurement","Runtime"
Conference_Titel :
Dependable Systems and Networks (DSN), 2015 45th Annual IEEE/IFIP International Conference on
DOI :
10.1109/DSN.2015.44