Title :
Fine-Grained Characterization of Faults Causing Long Latency Crashes in Programs
Author :
Guanpeng Li;Qining Lu;Karthik Pattabiraman
Author_Institution :
Dept. of Electr. &
fDate :
6/1/2015 12:00:00 AM
Abstract :
As the rate of transient hardware faults increases, researchers have investigated software techniques to tolerate these faults. An important class of faults are those that cause long- latency crashes (LLCs), or faults that can persist for a long time in the program before causing it to crash. In this paper, we develop a technique to automatically find program locations where LLC causing faults originate so that the locations can be protected to bound the program´s crash latency. We first identify program code patterns that are responsible for the majority of LLC causing faults through an empirical study. We then build CRASHFINDER, a tool that finds LLC locations by statically searching the program for the patterns, and then refining the static analysis results with a dynamic analysis and selective fault injection-based approach. We find that CRASHFINDER can achieve an average of 9.29 orders of magnitude time reduction to identify more than 90% of LLC causing locations in the program, compared to exhaustive fault injection techniques, and has no false-positives.
Keywords :
"Computer crashes","Hardware","Fault diagnosis","Benchmark testing","Arrays","Program processors"
Conference_Titel :
Dependable Systems and Networks (DSN), 2015 45th Annual IEEE/IFIP International Conference on
DOI :
10.1109/DSN.2015.36