DocumentCode
3658005
Title
Reliable CPS Design for Mitigating Semiconductor and Battery Aging in Electric Vehicles
Author
Wanli Chang;Alma Proebstl;Dip Goswami;Majid Zamani;Samarjit Chakraborty
Author_Institution
TUM CREATE, Singapore, Singapore
fYear
2015
Firstpage
37
Lastpage
42
Abstract
Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.
Keywords
"Batteries","Aging","Process control","Control systems","Reliability engineering","Delays"
Publisher
ieee
Conference_Titel
Cyber-Physical Systems, Networks, and Applications (CPSNA), 2015 IEEE 3rd International Conference on
Type
conf
DOI
10.1109/CPSNA.2015.16
Filename
7272682
Link To Document