• DocumentCode
    3658005
  • Title

    Reliable CPS Design for Mitigating Semiconductor and Battery Aging in Electric Vehicles

  • Author

    Wanli Chang;Alma Proebstl;Dip Goswami;Majid Zamani;Samarjit Chakraborty

  • Author_Institution
    TUM CREATE, Singapore, Singapore
  • fYear
    2015
  • Firstpage
    37
  • Lastpage
    42
  • Abstract
    Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.
  • Keywords
    "Batteries","Aging","Process control","Control systems","Reliability engineering","Delays"
  • Publisher
    ieee
  • Conference_Titel
    Cyber-Physical Systems, Networks, and Applications (CPSNA), 2015 IEEE 3rd International Conference on
  • Type

    conf

  • DOI
    10.1109/CPSNA.2015.16
  • Filename
    7272682