DocumentCode :
3658005
Title :
Reliable CPS Design for Mitigating Semiconductor and Battery Aging in Electric Vehicles
Author :
Wanli Chang;Alma Proebstl;Dip Goswami;Majid Zamani;Samarjit Chakraborty
Author_Institution :
TUM CREATE, Singapore, Singapore
fYear :
2015
Firstpage :
37
Lastpage :
42
Abstract :
Reliability and performance of cyber-physical systems (CPS) in electric vehicles (EVs) are influenced by three design aspects: (i) controller design, (ii) battery usage, i.e., Battery rate capacity and aging effects, (iii) processor aging of the in-vehicle embedded platform. In this paper, we present a two-phase design optimization framework involving control algorithm development, battery modeling and processor aging analysis. First, before processor aging, a Pareto front between quality of control (QoC) and battery usage is obtained. Second, as the processor ages, the controller is re-optimized considering the prolonged sampling period to avoid QoC deterioration of safety-critical applications with a compromise on battery usage and comfort-related applications. An outlook following this line of research on reliable CPS design in EVs is discussed, that we believe, will be pursued by researchers in the CPS community.
Keywords :
"Batteries","Aging","Process control","Control systems","Reliability engineering","Delays"
Publisher :
ieee
Conference_Titel :
Cyber-Physical Systems, Networks, and Applications (CPSNA), 2015 IEEE 3rd International Conference on
Type :
conf
DOI :
10.1109/CPSNA.2015.16
Filename :
7272682
Link To Document :
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