DocumentCode :
3658047
Title :
Combinatorial Testing for Tree-Structured Test Models with Constraints
Author :
Takashi Kitamura;Akihisa Yamada;Goro Hatayama;Cyrille Artho;Eun-Hye Choi;Ngoc Thi Bich Do;Yutaka Oiwa;Shinya Sakuragi
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. &
fYear :
2015
Firstpage :
141
Lastpage :
150
Abstract :
In this paper, we develop a combinatorial testing technique for tree-structured test models. First, we generalize our previous test models for combinatorial testing based on AND-XOR trees with constraints limited to a syntactic subset of propositional logic, to allow for constraints in full propositional logic. We prove that the generalized test models are strictly more expressive than the limited ones. Then we develop an algorithm for combinatorial testing for the generalized models, and show its correctness and computational complexity. We apply a tool based on our algorithm to an actual ticket gate system that is used by several large transportation companies in Japan. Experimental results show that our technique outperforms existing techniques.
Keywords :
"Tunneling magnetoresistance","Credit cards","Testing","Vegetation","Integrated circuit modeling","Companies","Electronic mail"
Publisher :
ieee
Conference_Titel :
Software Quality, Reliability and Security (QRS), 2015 IEEE International Conference on
Type :
conf
DOI :
10.1109/QRS.2015.29
Filename :
7272925
Link To Document :
بازگشت