• DocumentCode
    3658792
  • Title

    An all-digital adaptive approach to combat aging effects in clock networks

  • Author

    Senthil Arasu;Mehrdad Nourani;Hao Luo

  • Author_Institution
    Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX 75080
  • fYear
    2015
  • Firstpage
    102
  • Lastpage
    107
  • Abstract
    In this paper, we analyze the impact of asymmetrical aging due to Bias Temperature Instability (BTI) in the clock tree segments of power efficient designs. The nonuniform aging of launch and capture clock segments could not only violate the setup timing but also result in gross hold violations. Aging in clock networks also results in pulse width compression which impacts the half-cycle paths´ timing adversely. We present a reference-less alldigital technique to detect the aging effects and measure quantitatively the extent of pulse-width-distortion. The measurement results are then applied to rectify the pulse width distortion such that the clock network output is restored to a 50-50 duty cycle. The technique is validated using SPICE simulation based on 45nm industry standard library. A resolution of sub-1ps is achievable for both distortion measurement and correction circuits.
  • Keywords
    "Clocks","Aging","Stress","Delays","Logic gates","Distortion"
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2015 6th Asia Symposium on
  • Type

    conf

  • DOI
    10.1109/ACQED.2015.7274016
  • Filename
    7274016