DocumentCode :
3658792
Title :
An all-digital adaptive approach to combat aging effects in clock networks
Author :
Senthil Arasu;Mehrdad Nourani;Hao Luo
Author_Institution :
Department of Electrical Engineering, The University of Texas at Dallas, Richardson, TX 75080
fYear :
2015
Firstpage :
102
Lastpage :
107
Abstract :
In this paper, we analyze the impact of asymmetrical aging due to Bias Temperature Instability (BTI) in the clock tree segments of power efficient designs. The nonuniform aging of launch and capture clock segments could not only violate the setup timing but also result in gross hold violations. Aging in clock networks also results in pulse width compression which impacts the half-cycle paths´ timing adversely. We present a reference-less alldigital technique to detect the aging effects and measure quantitatively the extent of pulse-width-distortion. The measurement results are then applied to rectify the pulse width distortion such that the clock network output is restored to a 50-50 duty cycle. The technique is validated using SPICE simulation based on 45nm industry standard library. A resolution of sub-1ps is achievable for both distortion measurement and correction circuits.
Keywords :
"Clocks","Aging","Stress","Delays","Logic gates","Distortion"
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2015 6th Asia Symposium on
Type :
conf
DOI :
10.1109/ACQED.2015.7274016
Filename :
7274016
Link To Document :
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