DocumentCode :
3658805
Title :
Non-linearity analysis of stochastic time-to-digital converter
Author :
Val Mikos;Toru Nakura;Kunihiro Asada
Author_Institution :
ETH Zurich &
fYear :
2015
Firstpage :
171
Lastpage :
176
Abstract :
Stochastic TDCs excel in high resolution at narrow dynamic ranges by employing comparators which have their decision influenced by PVT variations. As the functionality relies on these variations, a transfer function akin to the Gaussian distribution ensues, which is non-linear. We propose a theoretical derivation of the non-linearity analysis and use it to find the stochastic TDC´s effective resolution and optimal dynamic range. Software and circuit Monte Carlo simulations are conducted in support of the theoretical findings, where the circuit employs comparators implemented in 180nm CMOS technology.
Keywords :
"Dynamic range","Transfer functions","Random variables","Time measurement","Transistors","Integrated circuit modeling","Standards"
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2015 6th Asia Symposium on
Type :
conf
DOI :
10.1109/ACQED.2015.7274029
Filename :
7274029
Link To Document :
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