Title :
Understanding the underlying physics of superior endurance in Bi-layered TaOX-RRAM
Author :
Y. D. Zhao;P. Huang;Z. Chen;C. Liu;H. T. Li;W. J. Ma;B. Gao;X. Y. Liu;J. F. Kang
Author_Institution :
Institute of Microelectronics, Peking University, Beijing 100871, China
fDate :
6/1/2015 12:00:00 AM
Abstract :
A comprehensive physical model is introduced to account for the superior endurance characteristics of TaOX-based RRAM with bi-layered Ta2O5-X/TaO2-X stack by considering the influence of oxygen content in TaO2-X layer. In the physical model, the TaO2-X layer acts as an oxygen reservoir to store and release oxygen ions (O2-) during switching cycles and different oxygen contents in TaO2-X layer correspond to different capabilities to take redox reactions with O2-. The proposed model is implemented into an atomic Monte-Carlo simulator involving the evolution of oxygen distribution in Ta2O5-X/TaO2-X stack to reproduce the impacts of different TaO2-X layers on endurance performance. Results reveal that the optimized TaO2-X layer with the feature of easily storing O2- as lattice oxygen (LO) during SET and decomposing to release O2- during RESET is beneficial to enhance the endurance property.
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2015