Title :
Performance analysis of low power microcode based asynchronous P-MBIST
Author :
Yasha Jyothi M Shirur;Bilure Chetana Bhimashankar;Veena S Chakravarthi
Author_Institution :
ECE Department, BNM Institute of Technology, BSK II Stage, Bangalore, India
Abstract :
In today´s VLSI world, the designers concentrate on low power design, neglecting the test methodology. Defining low power test methodology is the need of the day. In this paper, Microcode based Asynchronous P-MBIST is implemented, measured and compared with similar feature Synchronous PMBIST. The implemented core has given Power, Area advantage of 95.44%, 23.95% respectively but with increased Timing of 10.04% over Synchronous P-MBIST. The design is a synthesizable core which can be extended to multiple memory fault testing. The implemented design is synthesized over two different technology 180nm & 45nm. Even, the methodology adopted has given power advantage in scaled down technology.
Keywords :
"Circuit faults","Testing","Clocks","Simulation","Memory management","Multiplexing","Generators"
Conference_Titel :
Advances in Computing, Communications and Informatics (ICACCI), 2015 International Conference on
Print_ISBN :
978-1-4799-8790-0
DOI :
10.1109/ICACCI.2015.7275667