DocumentCode :
3664381
Title :
Analysis of non-insertable device under test measurement error with vector network analyzer
Author :
Haiyang Zhang;Jingkun Liu;Jian Jiang
Author_Institution :
The 41st Institute of China Electronics Technology Group Corporation, No. 98, Xiangjiang Road, Economic &
fYear :
2015
fDate :
5/1/2015 12:00:00 AM
Firstpage :
276
Lastpage :
280
Abstract :
The paper introduces the 12 error terms calibration model algorithm of vector network analyzer(VNA) based on the signal flow graph theory and the Mason formula, and proposes the full 2-port calibration method. The influence of the error caused by measuring non-insertable DUTs with the VNA to the measuring results is analyzed and a corresponding compensation algorithm is given. Meanwhile, this paper discusses how the transmission measurement error is affected respectively by hardware performance of the VNA, the reflection coefficient and transmission coefficient of the through calibration kit and the S parameters of the DUT. Finally, an algorithm which can eliminate the unknown through is presented.
Keywords :
"Calibration","Ports (Computers)","Switches","Measurement uncertainty","Reflection coefficient","Loss measurement","Measurement errors"
Publisher :
ieee
Conference_Titel :
Electronics Information and Emergency Communication (ICEIEC), 2015 5th International Conference on
Print_ISBN :
978-1-4799-7283-8
Type :
conf
DOI :
10.1109/ICEIEC.2015.7284538
Filename :
7284538
Link To Document :
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