• DocumentCode
    3664664
  • Title

    Supply-variation-resilient nonvolatile 3D IC and 3D memory using low peak-current on-chip charge-pump circuits

  • Author

    Meng-Fan Chang;Wang-Ying Lu;Shin-Jang Shen;Ming-Pin Chen;Chih-Sheng Lin;S.-S. Sheu;C.-H. Hung;Y.-S. Yang;Y.-J. Kuo;S.-N. Hung;H.-T. Lue;Chang-Hong Shen;Jia-Min Shieh

  • Author_Institution
    National Tsing Hua University, Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    In heterogeneous nonvolatile 3D-ICs, nonvolatile memory modules are used to enable reliable computing and smart power on-off management as a means of suppressing system standby current. This paper discusses the challenges caused by supply noise variations in 3D-IC and 3D-memory modules, including 3D-RAM, 3D monolithic ICs, vertical-device-stacking nonvolatile-SRAM, and 3D vertical-gate NAND flash. Cross-layer supply noise in 3D-IC and 3D-memory is reduced by implementing low peak-current on-chip charge-pump (CP) circuits using a split asymmetrically shifted clocking (SAS) scheme. A fabricated 90nm testchip with SAS and conventional CPs confirms that the proposed scheme is able to reduce power noise by 60+% and improves power efficiency by 7% with an area penalty of less than 3%, compared to a conventional CP operating at the same frequency.
  • Keywords
    "Conferences","Electron devices","Solid state circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4799-8362-9
  • Type

    conf

  • DOI
    10.1109/EDSSC.2015.7285064
  • Filename
    7285064