DocumentCode :
3664711
Title :
Scan-based side-channel attack against symmetric key ciphers using scan signatures
Author :
Mika Fujishiro;Youhua Shi;Masao Yanagisawa;Nozomu Togawa
Author_Institution :
Department of Computer Science and Engineering, Waseda University
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
309
Lastpage :
312
Abstract :
There are a number of studies on a side-channel attack which uses information exploited from the physical implementation of a cryptosystem. A scan-based side-channel attack utilizes scan chains, one of design-for-test techniques and retrieves the secret information inside the cryptosystem. In this paper, scan-based side-channel attack methods against symmetric key ciphers such as block ciphers and stream ciphers using scan signatures are presented to show the risk of scan-based attacks.
Keywords :
"Large scale integration","Light emitting diodes","Registers","Ciphers","Design for testability","Encryption"
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
Type :
conf
DOI :
10.1109/EDSSC.2015.7285112
Filename :
7285112
Link To Document :
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