Title :
True Random Number Generator in 0.35/μm for RFID applications
Author :
Zhengyu Chen;Wenbo Yin;Kevin Boyle
Author_Institution :
School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, U.S.A
fDate :
6/1/2015 12:00:00 AM
Abstract :
True Random Number Generator (TRNG) circuits have important applications in RFID security. This project implements a TRNG circuit in 0.35μm. Our architecture uses the noise of transistor as a random seed. The noise is amplified and added on top of a triangle wave. The jittered triangle wave is then compared to a reference signal which generates a jittered clock. This jittered clock is used to sample a faster clock available on chip, and produces the desired random number.
Keywords :
"Conferences","Electron devices","Solid state circuits"
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
DOI :
10.1109/EDSSC.2015.7285193
