Title :
SiC current limiting devices for surge protection
Author :
Amit K. Tiwari;A. B. Horsfall;N. G. Wright;P. Wallace;L. Mills;D. T. Clark;R. A. Young;S. Turvey
Author_Institution :
School of EEE, Newcastle University Newcastle upon Tyne, NE1 7RU, UK
fDate :
6/1/2015 12:00:00 AM
Abstract :
Current limiting devices (CLD), which employ back-to-back connected high voltage normally-ON SiC-based vertical junction filed effect transistors (VJFETs), are realized to protect the sensitive aircraft electronics from the adverse effects of a lightning strike to the airframe. The functionality of the packaged CLDs with high and low current levels is demonstrated in low voltage static and transient tests. Electro-thermal simulations are performed to optimize the thermal performance of CLDs for high-energy test environments.
Keywords :
"Silicon carbide","Lightning","Performance evaluation","Integrated circuit modeling","Limiting","Aerospace electronics","Surge protection"
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN :
978-1-4799-8362-9
DOI :
10.1109/EDSSC.2015.7285232
