• DocumentCode
    3664837
  • Title

    Effect of disparate carrier velocity in GaN on the terahertz characteristics of double drift region mixed tunnelling avalanche transit time diode

  • Author

    G. N. Dash;P. Panda;S. N. Padhi

  • Author_Institution
    Electron Devices Group at the School of Physics, Sambalpur University, Jyoti Vihar, Sambalpur - 768019, Odisha, India
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    800
  • Lastpage
    803
  • Abstract
    The potentials of GaN as a terahertz source is explored using some computer simulation programs developed by the authors. Contrary to the expectation, the power generating potential of GaN is observed to be much inferior to that of SiC due to the disparate carrier velocity in the former. In addition, GaN produces roughly 10 dB more noise compared to SiC when operated as a double drift region mixed tunneling avalanche transit time diode in the near terahertz region.
  • Keywords
    "Conferences","Electron devices","Solid state circuits"
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
  • Print_ISBN
    978-1-4799-8362-9
  • Type

    conf

  • DOI
    10.1109/EDSSC.2015.7285239
  • Filename
    7285239