DocumentCode
3664837
Title
Effect of disparate carrier velocity in GaN on the terahertz characteristics of double drift region mixed tunnelling avalanche transit time diode
Author
G. N. Dash;P. Panda;S. N. Padhi
Author_Institution
Electron Devices Group at the School of Physics, Sambalpur University, Jyoti Vihar, Sambalpur - 768019, Odisha, India
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
800
Lastpage
803
Abstract
The potentials of GaN as a terahertz source is explored using some computer simulation programs developed by the authors. Contrary to the expectation, the power generating potential of GaN is observed to be much inferior to that of SiC due to the disparate carrier velocity in the former. In addition, GaN produces roughly 10 dB more noise compared to SiC when operated as a double drift region mixed tunneling avalanche transit time diode in the near terahertz region.
Keywords
"Conferences","Electron devices","Solid state circuits"
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2015 IEEE International Conference on
Print_ISBN
978-1-4799-8362-9
Type
conf
DOI
10.1109/EDSSC.2015.7285239
Filename
7285239
Link To Document