DocumentCode
3666355
Title
Overview of high voltage 4H-SiC photoconductive semiconductor switch efforts at texas tech university
Author
Daniel Mauch;Chris White;David Thomas;Andreas Neuber;James Dickens
Author_Institution
Texas Tech University, Center for Pulsed Power and Power Electronics, Lubbock, TX 79409, USA
fYear
2014
fDate
6/1/2014 12:00:00 AM
Firstpage
23
Lastpage
26
Abstract
Recent advances and the current state-of-the-art for high speed 4H-SiC photoconductive semiconductor switches (PCSS) developed at Texas Tech University are summarized. A performance comparison of multiple generations of switch designs is also presented. These devices have experimentally demonstrated the capability of blocking DC electric fields up to 705 kV/cm (<;0.1 mA leakage current), rise times of 0.63 ns (20/80), and switching 20 kV at 250 A with a di/dt of 75 kA/us at a burst repetition frequency of 65 MHz. Findings and optimizations pertaining to device geometry, sub-contact doping, contact thickness, triggering wavelength, and electron irradiation are presented. Device modeling and experimental results investigating current issues with device lifetime are presented as well.
Keywords
"Optical switches","Radiative recombination","Silicon carbide","Geometry","Electric fields","Electron traps"
Publisher
ieee
Conference_Titel
Power Modulator and High Voltage Conference (IPMHVC), 2014 IEEE International
Print_ISBN
978-1-4673-7323-4
Type
conf
DOI
10.1109/IPMHVC.2014.7287198
Filename
7287198
Link To Document