Title :
Testing single phase IGBT H-bridge switch plates for the high voltage converter modulator at the Spallation Neutron Source
Author :
Vladimir V. Peplov;David E. Anderson;Dennis J. Solley
Author_Institution :
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN 37831 USA
fDate :
6/1/2014 12:00:00 AM
Abstract :
Three IGBT H-bridge switching networks are used in each High Voltage Converter Modulator (HVCM) system at the Spallation Neutron Source (SNS) to generate drive currents to three boost transformer primaries switching between positive and negative bus voltages at 20 kHz. Every switch plate assembly is tested before installing it into an operational HVCM. A Single Phase Test Stand has been built for this purpose, and it is used for adjustment, measurement and testing of different configurations of switch plates. This paper will present a description of the Test Stand configuration and discuss the results of testing switch plates with two different types of IGBT gate drivers currently in use on the HVCM systems. Comparison of timing characteristics of the original and new drivers and the resulting performance reinforces the necessity to replace the original H-bridge network drivers with the upgraded units.
Keywords :
"Insulated gate bipolar transistors","Logic gates","Optical switches","Timing","Testing","Modulation"
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2014 IEEE International
Print_ISBN :
978-1-4673-7323-4
DOI :
10.1109/IPMHVC.2014.7287367