Low-frequency noise in organic transistors

In this paper, we build on our previous work that introduced variable range hopping (VRH) as a plausible origin of flicker or low-frequency noise (LFN) in organic thin film transistors (OTFTs). While LFN is important in OTFTs, other issues with low mobility and contact effects are also active research and development efforts in the field. Since several LFN models have been proposed for OTFTs, then we compare and discuss the merits of each model. Specifically, we discuss models based on the Hooge equation, trapping (flat-band number fluctuation), VRH (conduction fluctuation) and the most recent layer-separation theory.