• DocumentCode
    3667207
  • Title

    Effects of radiation-induced changes in low-frequency noise of infrared detectors

  • Author

    Wei Hu;Yiqi Zhuang;Junlin Bao;Qifeng Zhao

  • Author_Institution
    School of Mechano-Electronic Engineering, Xidian University, Xi´an, China
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Low frequency noise is always used as a parameter to characterize the performance and reliability of electronics devices. In the study, a noise model of infrared detector which takes into account the grain and grain boundary was proposed. Then, the changes in low frequency noise, as an function of gamma irradiation at dose rate of 0.1 rad(Si)/s and 10 rad(Si)/s, are investigated. The experimental results shown that a lower dose rate irradiation induce more defects in infrared detector.
  • Keywords
    "Infrared detectors","Thermistors","Grain boundaries","Fluctuations","Low-frequency noise","Conductivity"
  • Publisher
    ieee
  • Conference_Titel
    Noise and Fluctuations (ICNF), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICNF.2015.7288620
  • Filename
    7288620
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3667207