DocumentCode :
3667901
Title :
Thermal simulation of nanosecond laser annealing of 3D sequential VLSI
Author :
Benoît Mathieu;Claire Fenouillet-Beranger;Sébastien Kerdiles;Jean-Charles Barbé
Author_Institution :
Univ. Grenoble Alpes, CEA, LETI, MINATEC Campus, France
fYear :
2015
Firstpage :
104
Lastpage :
107
Abstract :
A framework for the simulation of nanosecond laser annealing of structures found in 3D sequential integration is presented. The framework includes a finite difference frequency domain Maxwell solver and a Poisson solver for the thermal diffusion. Simple applications illustrate the advantages, expected difficulties and optimization levers of this annealing technique.
Keywords :
"Silicon","Optical films","Transistors","Temperature","Optical refraction","Optical variables control","Three-dimensional displays"
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
ISSN :
1946-1569
Print_ISBN :
978-1-4673-7858-1
Type :
conf
DOI :
10.1109/SISPAD.2015.7292269
Filename :
7292269
Link To Document :
بازگشت