DocumentCode
3667941
Title
Heterojunction resonant tunneling diode at the atomic limit
Author
Ram Krishna Ghosh;Yu-Chuan Lin;Joshua A. Robinson;Suman Datta
Author_Institution
Department of Electrical Engineering, The Pennsylvania State University, University Park, 16802, United States
fYear
2015
Firstpage
266
Lastpage
269
Abstract
In this work, we present atomically thin resonant tunnel diode, based on vertically stacked heterostructures by combining graphene with layered transition-metal dichalocogenides (TMDs) such as molybdenum disulfide (MoS2), and tungsten diselenide (WSe2). Density functional theory (DFT) coupled with non-equilibrium Green´s function (NEGF) transport calculation shows resonant tunnelling in heterolayer TMD and graphene (i.e. MoS2-WSe2-Gr) system with a prominent negative differential resistance (NDR) characteristic. However, homolayer TMD-graphene stack (i.e. bilayer WSe2-Gr) does not show any NDR in its I-V characteristics.
Keywords
"Electrodes","Graphene","Resonant tunneling devices","Semiconductor diodes","Discrete Fourier transforms","Scattering","Atomic layer deposition"
Publisher
ieee
Conference_Titel
Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on
ISSN
1946-1569
Print_ISBN
978-1-4673-7858-1
Type
conf
DOI
10.1109/SISPAD.2015.7292310
Filename
7292310
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