Intrinsic and extrinsic stability of Ovonic-switching devices

The time evolution of current and voltage in Ovonic-switching devices is affected, on one side, by parasitic elements due to contacts and connectors and, on the other one, by the internal-relaxation mechanisms of the material itself. The two aspects, respectively termed here “extrinsic” and “intrinsic” dynamics, are investigated in this paper on the basis of the time-dependent, trap-limited conduction model proposed by the authors for investigating this type of devices.