Title :
Spontaneous emission and reflectivity measurements for the characterization of facet-coatings of semiconductor lasers
Author :
Shoude Chang;Jiaren Liu;Zhenguo Lu;Daniel Poitras;Pedro Barrios;Philip Poole;Siegfried Janz
Author_Institution :
Information and Communications Technologies, National Research Council Canada. Ottawa, Ontario Canada K1A 0R6
fDate :
6/1/2015 12:00:00 AM
Abstract :
A new method for measuring the spontaneous emissions and spectral reflectivity of the facet coating of ridge lasers is described and demonstrated. We present results of spectrally-controlled coated quantum-dot laser waveguides.
Keywords :
"Optical waveguides","Semiconductor device measurement","Reflectivity","Semiconductor waveguides","Spontaneous emission","Waveguide lasers","Coatings"
Conference_Titel :
Photonics North, 2015
DOI :
10.1109/PN.2015.7292494
