DocumentCode :
3668456
Title :
Fundamental properties of GaN(0001) films grown directly on Gd2O3(0001) platforms: Ab initio structural simulations
Author :
Kuo-Cheng Liao;Po-Liang Liu;Huan-Chen Wang;Yu-Hsien Wang
Author_Institution :
Graduate Institute of Precision Engineering, National Chung Hsing UniversityNCHUTaichung 402, Taiwan
fYear :
2015
Firstpage :
119
Lastpage :
120
Abstract :
We present first-principles calculations to study the heterojunction between a wurtzite GaN(0001) film and a hexagonal Gd2O3(0001) substrate. We report that the most favorable Gd2O3(0001) surface is O terminated. Using the work of adhesion of isolated GaN and Gd2O3 slabs, our calculated interface energies suggest that the graphiticlike GaN films are fully relaxed at Gd2O3(0001) platforms, thereby leading to Ga-polarity in the GaN(0001) epitaxial film. Our findings agree with previously reported results.
Keywords :
"Gallium nitride","Epitaxial growth","Substrates","Semiconductor device modeling","Semiconductor process modeling","Slabs","Gadolinium"
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2015 International Conference on
ISSN :
2158-3234
Print_ISBN :
978-1-4799-8378-0
Type :
conf
DOI :
10.1109/NUSOD.2015.7292851
Filename :
7292851
Link To Document :
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