Compound Poisson noise verification for X-ray flat panel imager

Physical effects that contribute to the noise in digital radiography are possible to be represented as overall variance including Poisson statistics of x-rays. For real system, statement of the noise response must be integrated against a spectrum to get the total response to spectral fluence of x-ray, that the detected x-ray follows a compound-Poisson distribution. To verify the noise property of our x-ray flat-panel detector (FPD), we formulate a compound-Poisson based model to verify the image noise statistic from measured data. Results demonstrate that the FPD noise property is independed from the tube voltage; only 1.6% error is occurred by the model fitting. In this case, the noise property of our FPD can accurately be represented as the modeled function.