DocumentCode :
3669890
Title :
The charge transport characteristics of polyimide under electron beam and dc voltage
Author :
Guochang Li;Shengtao Li;Daomin Min;Shaoming Pan;Changhao Zhao
Author_Institution :
State Key Laboratory of Electrical Insulation and Power Equipment, Xi´an Jiaotong University, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
120
Lastpage :
123
Abstract :
Deposited charges in dielectric material under electron-beam radiation have an important influence on dc vacuum surface flashover. This paper investigates the charge transport characteristics of polyimide under electron-beam radiation and dc voltage. Based on the actual size of electrodes and polyimide, a physical model of electron-beam radiation is proposed. Considered the processes of charge deposition and transport and accumulation in polyimide radiated by low-energy electrons (electron energy: 5-30 keV, electron-beam density: 10-10 ~10-7A/m2), the distributions of space charge, potential and electric field can be obtained, and the total electric field at cathode triple junction under the combined action of electron radiation and dc voltage are analyzed. The calculation results indicate that when the electron-beam density is less relatively (<;10-9 A/m2), the weakening effect of built-in electric field on applied electric field is unobvious. With the increase of electronbeam density, the built-in electric field is gradually increased, resulting in the decrease of total electric field at the cathode triple junction. The total electric field is 8×105 V/m under the electron-beam density of 10-7 A/m2. It will reduce the initial electron emission at the cathode triple junction, and may enhance surface flashover voltage of dielectric material. Further experiment study will be carried out.
Keywords :
"Electric fields","Polyimides","Flashover","Junctions","Dielectric materials","Cathodes","Surface treatment"
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the
Electronic_ISBN :
2160-9241
Type :
conf
DOI :
10.1109/ICPADM.2015.7295223
Filename :
7295223
Link To Document :
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