DocumentCode :
3670082
Title :
Space charge injection with electron beam irradiation for polyethylene and polypropylene films
Author :
Hui Zhao;Yewen Zhang;Xiaoqian Zhou;Feihu Zheng;Zhenlian An
Author_Institution :
Department of Electrical Engineering, Tongji University, Shanghai 201804, China
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
891
Lastpage :
894
Abstract :
The charging phenomenon in the dielectric materials often occurs in various radiation environments such as in the outer space and in the irradiation facilities. The irradiated charge accumulation in the dielectric materials can cause a permanent change on physical and chemical structure of the material which influences the electric properties of dielectric materials. In order to improve the reliability of dielectric materials, it is valuable to investigate the charging electrical properties of dielectric materials under radiation environment. In this work, penetration depths and distributions of irradiated charge in 250um thick polyethylene (PE) and polypropylene (PP) films after injection of 40 to 60keV electrons in vacuum environment were measured using a non-destructive and direct technique called Piezo-electric Induced Pressure Wave Propagation (PIPWP) method. This method enables us to observe the charge accumulating/dissipating process in real time. The comparison of experimental and analytical results reveals the difference between mean charge depth and migration process. The results also indicate that the various densities and depths of traps have significant effects on charge injection and migration process. The electrical properties of PE and PP were also studied after all original specimens were radiated by electron beam at last and some valuable results were obtained.
Keywords :
"Radiation effects","Electron beams","Dielectric materials","Electrodes","Space charge","Films","Dielectric measurement"
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2015 IEEE 11th International Conference on the
Electronic_ISBN :
2160-9241
Type :
conf
DOI :
10.1109/ICPADM.2015.7295416
Filename :
7295416
Link To Document :
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