DocumentCode :
3670966
Title :
Characterization of the optical properties of GaN:Fe for high voltage photoconductive switch applications
Author :
V. Meyers;D. Mauch;J. Mankowski;J. Dickens;A. Neuber
Author_Institution :
Center for Pulsed Power and Power Electronics, Department of Electrical and Computer Engineering, Texas Tech University, 2500 Broadway, Mail stop 3102 Lubbock, TX, U.S.
fYear :
2015
fDate :
5/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
4
Abstract :
The optical properties of bulk semi-insulating GaN:Fe are obtained to assess its future suitability as a high voltage photoconductive semiconductor switch (PCSS). The material properties of GaN:Fe hold significant promise to improve devices for pulsed power and other applications. Growth techniques of bulk GaN:Fe, which have hitherto been largely insufficient for commercial applications, are nearing the point that anticipatory characterization research is warranted. In this paper, the optical constants of bulk GaN:Fe (refractive index, absorption coefficient, and off-state dielectric function) were determined by optical reflection/transmission analysis. The results of this analysis are compared with a similar treatment of bulk 4H-SiC as well as possible elements of PCSS housing: Sylgard 184 elastomer, and EFI 20003/50013 electrical potting epoxy. The data presented provide foundational material characterization to enable assessment of the feasibility of GaN:Fe as a practical high voltage PCSS material. Beyond basic materials research, these properties inform design optimization in PCSS construction and implementation.
Keywords :
"Optical switches","Optical reflection","Optical refraction","Optical variables control","Absorption","Gallium nitride","Refractive index"
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2015 IEEE
ISSN :
2158-4915
Electronic_ISBN :
2158-4923
Type :
conf
DOI :
10.1109/PPC.2015.7296862
Filename :
7296862
Link To Document :
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