A solid state HV test stand for simulated lifetime analysis of electric components

The University of Missouri-Columbia is presently developing 100-450 kV composite capacitors for compact pulsed power applications. To assess the lifetime of the nanodielectric capacitors, scaled high voltage tests are being conducted using a solid-state test stand that can operate at 48 kV. The 48 kV test stand is capable of discharging the scaled capacitors in 50 ns to 1 ms and has been designed to operate at a repetition rate of up to 1 kHz. The test stand consists of high voltage MOSFET boards, optical triggers, and a power oscillator board that provides isolated power to each high voltage switchboard. The MOSFET switch stages can be placed in series to provide hold off voltages from 40 kV up to 60 kV. The system allows for the rapid charge and discharge of the capacitor to assess the lifetime, losses of in the nanodielectric under pulsed conditions, and material characteristics as a function of lifetime. The performance of the test stand and initial lifetime data of the nanodielectric capacitors under scaled conditions are presented.