Efficient full-wave modeling of electromagnetic interference in the presence of multiple non-collocated noise sources

In this contribution a novel method is discussed that is of practical use for analyzing the electromagnetic compatibility behavior of electronic systems. The aim is to develop an efficient technique that mimics radiated immunity and emission tests in the presence of multiple non-collocated noise sources in simulation. The proposed method is simple in that it only relies on the simulated (or measured) radiation pattern of the devices in the system while allowing arbitrary positions. Rotation of the devices is performed by a spherical harmonics decomposition of the radiation patterns together with the application of Wigner-D rotation matrices. The adopted assumption is that the devices are spaced sufficiently far from each other such that there is no coupling via the reactive near-field. The proposed procedure shows good agreement with measurements and full-wave simulations while at the same time it has a low computational cost.