DocumentCode
3671261
Title
Physical-model-based image processing for feature aided analysis
Author
J. Smith;Erin Best;Emma Sum;Yasar Guzel;Michael A. Saville;Lorenzo LoMonte;Michael Wicks
Author_Institution
Department of Electrical Engineering, Wright State University, Fairborn, Ohio 45435 USA
fYear
2015
Firstpage
565
Lastpage
568
Abstract
Attributed scattering center models can relate radar measurements to physical target features. This paper summarizes recent signal processing methods for attributing synthetic aperture radar images with emphasis on feature space definition for object recognition. Examples using laboratory measured inverse synthetic aperture radar data and simulated data are provided.
Keywords
"Scattering","Synthetic aperture radar","Radar imaging","Libraries","Object recognition","Vehicles"
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2015 International Conference on
Type
conf
DOI
10.1109/ICEAA.2015.7297179
Filename
7297179
Link To Document