Title :
Modeling of mutual coupling between coaxial probes in flat metallic casings using the contour integral method
Author :
Q. Wu;A. Vogt;J. B. Preibisch;A. Hardock;H.-D. Brüns;C. Schuster
Author_Institution :
School of Electronics and Information Engineering, Beihang University, Beijing 100191, China
Abstract :
This paper investigates electromagnetic interference mechanisms in flat metallic casings using the contour integral method (CIM). Coaxial monopole probes are used to represent potential radiators, and a local field model is developed and combined with the CIM for evaluation of mutual admittance between the probes. Limitations of the method are discussed.
Keywords :
"Computer integrated manufacturing","Probes","Ports (Computers)","Capacitance","Finite element analysis","Loading","Mutual coupling"
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2015 International Conference on
DOI :
10.1109/ICEAA.2015.7297203
