• DocumentCode
    3671284
  • Title

    Modeling of mutual coupling between coaxial probes in flat metallic casings using the contour integral method

  • Author

    Q. Wu;A. Vogt;J. B. Preibisch;A. Hardock;H.-D. Brüns;C. Schuster

  • Author_Institution
    School of Electronics and Information Engineering, Beihang University, Beijing 100191, China
  • fYear
    2015
  • Firstpage
    692
  • Lastpage
    695
  • Abstract
    This paper investigates electromagnetic interference mechanisms in flat metallic casings using the contour integral method (CIM). Coaxial monopole probes are used to represent potential radiators, and a local field model is developed and combined with the CIM for evaluation of mutual admittance between the probes. Limitations of the method are discussed.
  • Keywords
    "Computer integrated manufacturing","Probes","Ports (Computers)","Capacitance","Finite element analysis","Loading","Mutual coupling"
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications (ICEAA), 2015 International Conference on
  • Type

    conf

  • DOI
    10.1109/ICEAA.2015.7297203
  • Filename
    7297203
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3671284