DocumentCode
3672093
Title
Deep transfer metric learning
Author
Junlin Hu;Jiwen Lu;Yap-Peng Tan
Author_Institution
School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
325
Lastpage
333
Abstract
Conventional metric learning methods usually assume that the training and test samples are captured in similar scenarios so that their distributions are assumed to be the same. This assumption doesn´t hold in many real visual recognition applications, especially when samples are captured across different datasets. In this paper, we propose a new deep transfer metric learning (DTML) method to learn a set of hierarchical nonlinear transformations for cross-domain visual recognition by transferring discriminative knowledge from the labeled source domain to the unlabeled target domain. Specifically, our DTML learns a deep metric network by maximizing the inter-class variations and minimizing the intra-class variations, and minimizing the distribution divergence between the source domain and the target domain at the top layer of the network. To better exploit the discriminative information from the source domain, we further develop a deeply supervised transfer metric learning (DSTML) method by including an additional objective on DTML where the output of both the hidden layers and the top layer are optimized jointly. Experimental results on cross-dataset face verification and person re-identification validate the effectiveness of the proposed methods.
Keywords
"Measurement","Training","Face","Learning systems","Visualization","Machine learning","Face recognition"
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2015.7298629
Filename
7298629
Link To Document