DocumentCode
3672191
Title
Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction
Author
Srikumar Ramalingam;Michel Antunes;Daniel Snow;Gim Hee Lee;Sudeep Pillai
Author_Institution
Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA
fYear
2015
fDate
6/1/2015 12:00:00 AM
Firstpage
1238
Lastpage
1246
Abstract
We propose a simple and useful idea based on cross-ratio constraint for wide-baseline matching and 3D reconstruction. Most existing methods exploit feature points and planes from images. Lines have always been considered notorious for both matching and reconstruction due to the lack of good line descriptors. We propose a method to generate and match new points using virtual lines constructed using pairs of keypoints, which are obtained using standard feature point detectors. We use cross-ratio constraints to obtain an initial set of new point matches, which are subsequently used to obtain line correspondences. We develop a method that works for both calibrated and uncalibrated camera configurations. We show compelling line-matching and large-scale 3D reconstruction.
Keywords
"Three-dimensional displays","Cameras","Image reconstruction","Calibration","Accuracy","Feature extraction","Detectors"
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
Electronic_ISBN
1063-6919
Type
conf
DOI
10.1109/CVPR.2015.7298728
Filename
7298728
Link To Document