DocumentCode :
3672191
Title :
Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction
Author :
Srikumar Ramalingam;Michel Antunes;Daniel Snow;Gim Hee Lee;Sudeep Pillai
Author_Institution :
Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA
fYear :
2015
fDate :
6/1/2015 12:00:00 AM
Firstpage :
1238
Lastpage :
1246
Abstract :
We propose a simple and useful idea based on cross-ratio constraint for wide-baseline matching and 3D reconstruction. Most existing methods exploit feature points and planes from images. Lines have always been considered notorious for both matching and reconstruction due to the lack of good line descriptors. We propose a method to generate and match new points using virtual lines constructed using pairs of keypoints, which are obtained using standard feature point detectors. We use cross-ratio constraints to obtain an initial set of new point matches, which are subsequently used to obtain line correspondences. We develop a method that works for both calibrated and uncalibrated camera configurations. We show compelling line-matching and large-scale 3D reconstruction.
Keywords :
"Three-dimensional displays","Cameras","Image reconstruction","Calibration","Accuracy","Feature extraction","Detectors"
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
Electronic_ISBN :
1063-6919
Type :
conf
DOI :
10.1109/CVPR.2015.7298728
Filename :
7298728
Link To Document :
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