• DocumentCode
    3672191
  • Title

    Line-sweep: Cross-ratio for wide-baseline matching and 3D reconstruction

  • Author

    Srikumar Ramalingam;Michel Antunes;Daniel Snow;Gim Hee Lee;Sudeep Pillai

  • Author_Institution
    Mitsubishi Electric Research Laboratories (MERL), Cambridge, USA
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    1238
  • Lastpage
    1246
  • Abstract
    We propose a simple and useful idea based on cross-ratio constraint for wide-baseline matching and 3D reconstruction. Most existing methods exploit feature points and planes from images. Lines have always been considered notorious for both matching and reconstruction due to the lack of good line descriptors. We propose a method to generate and match new points using virtual lines constructed using pairs of keypoints, which are obtained using standard feature point detectors. We use cross-ratio constraints to obtain an initial set of new point matches, which are subsequently used to obtain line correspondences. We develop a method that works for both calibrated and uncalibrated camera configurations. We show compelling line-matching and large-scale 3D reconstruction.
  • Keywords
    "Three-dimensional displays","Cameras","Image reconstruction","Calibration","Accuracy","Feature extraction","Detectors"
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2015.7298728
  • Filename
    7298728