Title :
Reflectance hashing for material recognition
Author :
Hang Zhang;Kristin Dana;Ko Nishino
Author_Institution :
Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854, USA
fDate :
6/1/2015 12:00:00 AM
Abstract :
We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work, one-shot reflectance of a material surface which we refer to as a reflectance disk is capturing using a unique optical camera. The pixel coordinates of these reflectance disks correspond to the surface viewing angles. The reflectance has class-specific stucture and angular gradients computed in this reflectance space reveal the material class. These reflectance disks encode discriminative information for efficient and accurate material recognition. We introduce a framework called reflectance hashing that models the reflectance disks with dictionary learning and binary hashing. We demonstrate the effectiveness of reflectance hashing for material recognition with a number of real-world materials.
Keywords :
"Cameras","Mirrors","Lighting","Boosting","Surface treatment","Apertures","Surface texture"
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
Electronic_ISBN :
1063-6919
DOI :
10.1109/CVPR.2015.7298926