• DocumentCode
    3672510
  • Title

    Integrating parametric and non-parametric models for scene labeling

  • Author

    Bing Shuai;Gang Wang;Zhen Zuo;Bing Wang;Lifan Zhao

  • Author_Institution
    School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798
  • fYear
    2015
  • fDate
    6/1/2015 12:00:00 AM
  • Firstpage
    4249
  • Lastpage
    4258
  • Abstract
    We adopt Convolutional Neural Networks (CNN) as our parametric model to learn discriminative features and classifiers for local patch classification. As visually similar pixels are indistinguishable from local context, we alleviate such ambiguity by introducing a global scene constraint. We estimate the global potential in a non-parametric framework. Furthermore, a large margin based CNN metric learning method is proposed for better global potential estimation. The final pixel class prediction is performed by integrating local and global beliefs. Even without any post-processing, we achieve state-of-the-art performance on SiftFlow and competitive results on Stanford Background benchmark.
  • Keywords
    "Labeling","Context","Measurement","Semantics","Yttrium","Estimation","Roads"
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2015 IEEE Conference on
  • Electronic_ISBN
    1063-6919
  • Type

    conf

  • DOI
    10.1109/CVPR.2015.7299053
  • Filename
    7299053