DocumentCode
3673878
Title
Experimental determining ideality coefficient for different kind of semiconductor diodes using NI ELVIS II+
Author
Gheorghe Andrei;Ion Sima;Cristian Andrei
Author_Institution
“
fYear
2015
fDate
6/1/2015 12:00:00 AM
Abstract
This paper propose the experimental determination of ideality coefficient or emission coefficient for an actual diode in laboratory, using NI ELVIS II+, which enables current-voltage characteristic lifting semi-logarithmic coordinates. In addition it is determined the reverse bias saturation current of diode.
Keywords
"Schottky diodes","Semiconductor device measurement","Current measurement","Nickel","Silicon","Current-voltage characteristics"
Publisher
ieee
Conference_Titel
Electronics, Computers and Artificial Intelligence (ECAI), 2015 7th International Conference on
Print_ISBN
978-1-4673-6646-5
Type
conf
DOI
10.1109/ECAI.2015.7301251
Filename
7301251
Link To Document