Title :
High-speed heterostructure photodetectors characterisation
Author :
M. Tombska;F. Uherek;J. Jakabovic
Author_Institution :
Dept. of Microelectron., Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
A measurement set-up for high-speed photodetector properties investigation in frequency domain up to 20 GHz is described. Using this set-up, heterostructure photodetectors were characterised employing microwave reflection coefficient and/or optoelectronic transmission coefficient measurements. The equivalent circuit of the photodetector device was identified from microwave reflection coefficient measurements. Transmission measurements and simulations of photodetector were performed and compared in time and/or frequency domain.
Keywords :
"Photodetectors","Frequency measurement","Frequency domain analysis","Microwave devices","Reflection","Microwave measurements","Equivalent circuits","Time measurement","Circuit simulation","Performance evaluation"
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM ´98. Second International Conference on
Print_ISBN :
0-7803-4909-1
DOI :
10.1109/ASDAM.1998.730176
