• DocumentCode
    3674561
  • Title

    Multi-scale modeling of metal-CNT interfaces

  • Author

    M. Claus;A. Fediai;S. Mothes;A. Pacheco;D. Ryndyk;S. Blawid;G. Cuniberti;M. Schroter

  • Author_Institution
    Center for Advancing Electronics Dresden, TU Dresden, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The authors studied the impact of contact materials on CNTFET behavior using multiscale modeling and simulation framework. A strong correlation between metal-CNT coupling strength, contact length and contact resistance was found. The atomistic simulation was used to adjust the contact model used within the transport studies at the device level.
  • Keywords
    "CNTFETs","Contact resistance","Metals","Computational modeling","Effective mass","Integrated circuit modeling"
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics (IWCE), 2015 International Workshop on
  • Type

    conf

  • DOI
    10.1109/IWCE.2015.7301946
  • Filename
    7301946
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3674561