Title :
Multi-scale modeling of metal-CNT interfaces
Author :
M. Claus;A. Fediai;S. Mothes;A. Pacheco;D. Ryndyk;S. Blawid;G. Cuniberti;M. Schroter
Author_Institution :
Center for Advancing Electronics Dresden, TU Dresden, Germany
Abstract :
The authors studied the impact of contact materials on CNTFET behavior using multiscale modeling and simulation framework. A strong correlation between metal-CNT coupling strength, contact length and contact resistance was found. The atomistic simulation was used to adjust the contact model used within the transport studies at the device level.
Keywords :
"CNTFETs","Contact resistance","Metals","Computational modeling","Effective mass","Integrated circuit modeling"
Conference_Titel :
Computational Electronics (IWCE), 2015 International Workshop on
DOI :
10.1109/IWCE.2015.7301946
