DocumentCode :
3674567
Title :
Strain effects on the electronic properties of devices made of twisted graphene layers
Author :
Viet-Hung Nguyen;Jerome Saint-Martin;Philippe Dollfus;Huy-Viet Nguyen
Author_Institution :
Institut d´Electronique Fondamentale, CNRS, Univ Paris Sud, Universit? Paris-Saclay Orsay, France
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
The effects of uniaxial strain on the electronic and transport properties of twisted graphene bilayer structures are investigated by means of atomistic simulation. It is shown that the strain-induced modulation of band structure makes it possible to break the degeneracy and to modulate the position van Hove singularities. It is even possible to observe low-energy saddle points for a large range of twist angles. It is shown also that the strain-induced separation of Dirac points of the two lattices may generate a finite transport gap as large as a few hundreds of meV for a small strain of a few percent.
Keywords :
"Graphene","Lattices","Modulation","Transistors","Uniaxial strain","Atomic layer deposition"
Publisher :
ieee
Conference_Titel :
Computational Electronics (IWCE), 2015 International Workshop on
Type :
conf
DOI :
10.1109/IWCE.2015.7301952
Filename :
7301952
Link To Document :
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