Title :
Mid-infrared LEDs using InAs/sub 0.71/Sb/sub 0.29//InAs/Al/sub 0.25/In/sub 0.75/As/InAs strained-layer superlattice active layers
Author :
C. Van Hoof;S. Nemeth;B. Grieten;K. Dessein;J. Genoe;P. Merken;G. Borghs;F. Fuchs;J. Wagner
Author_Institution :
IMEC, Leuven, Belgium
Abstract :
The use of strained-layer superlattice is a well-established technique to lower Auger recombination in the active layer of mid-IR LEDs and laser. We have shown by temperature-dependent photoluminescence experiments the Auger recombination can be further reduced by incorporating InAs spacer layer inside symmetrically-strained InAsSb/InAlAs superlattices and that the thickness of the spacer is critical for the improved operation. The layer were grown by molecular beam epitaxy on [001] InAs substrates. The crystalline quality of the grown superlattices is demonstrated by means of transmission electron microscopy, atomic force microscopy and X-ray diffraction measurement.
Keywords :
"Light emitting diodes","Superlattices","Atomic force microscopy","Transmission electron microscopy","Atomic measurements","Force measurement","Photoluminescence","Indium compounds","Molecular beam epitaxial growth","Substrates"
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM ´98. Second International Conference on
Print_ISBN :
0-7803-4909-1
DOI :
10.1109/ASDAM.1998.730219