DocumentCode
3674644
Title
Mid-infrared LEDs using InAs/sub 0.71/Sb/sub 0.29//InAs/Al/sub 0.25/In/sub 0.75/As/InAs strained-layer superlattice active layers
Author
C. Van Hoof;S. Nemeth;B. Grieten;K. Dessein;J. Genoe;P. Merken;G. Borghs;F. Fuchs;J. Wagner
Author_Institution
IMEC, Leuven, Belgium
fYear
1998
Firstpage
287
Lastpage
290
Abstract
The use of strained-layer superlattice is a well-established technique to lower Auger recombination in the active layer of mid-IR LEDs and laser. We have shown by temperature-dependent photoluminescence experiments the Auger recombination can be further reduced by incorporating InAs spacer layer inside symmetrically-strained InAsSb/InAlAs superlattices and that the thickness of the spacer is critical for the improved operation. The layer were grown by molecular beam epitaxy on [001] InAs substrates. The crystalline quality of the grown superlattices is demonstrated by means of transmission electron microscopy, atomic force microscopy and X-ray diffraction measurement.
Keywords
"Light emitting diodes","Superlattices","Atomic force microscopy","Transmission electron microscopy","Atomic measurements","Force measurement","Photoluminescence","Indium compounds","Molecular beam epitaxial growth","Substrates"
Publisher
ieee
Conference_Titel
Advanced Semiconductor Devices and Microsystems, 1998. ASDAM ´98. Second International Conference on
Print_ISBN
0-7803-4909-1
Type
conf
DOI
10.1109/ASDAM.1998.730219
Filename
730219
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