DocumentCode
3675428
Title
Multi-mode analysis of dual ridged waveguide systems for material characterization
Author
Jason G. Crosby;Milo W. Hyde;Michael J. Havrilla
Author_Institution
Air Force Institute of Technology, Wright Patterson AFB, Ohio, 45433, USA
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
33
Lastpage
33
Abstract
In this paper, two nondestructive dual ridged waveguide (DRWG) material characterization systems are investigated. Shown in Fig. 1, the single and clamped DRWG probe geometries were analyzed in previous work; however, that research only incorporated the dominant DRWG mode. Here, that restriction is removed and the existence of evanescent higher-order modes is considered.
Publisher
ieee
Conference_Titel
Radio Science Meeting (Joint with AP-S Symposium), 2015 USNC-URSI
Type
conf
DOI
10.1109/USNC-URSI.2015.7303317
Filename
7303317
Link To Document