• DocumentCode
    3675428
  • Title

    Multi-mode analysis of dual ridged waveguide systems for material characterization

  • Author

    Jason G. Crosby;Milo W. Hyde;Michael J. Havrilla

  • Author_Institution
    Air Force Institute of Technology, Wright Patterson AFB, Ohio, 45433, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    33
  • Lastpage
    33
  • Abstract
    In this paper, two nondestructive dual ridged waveguide (DRWG) material characterization systems are investigated. Shown in Fig. 1, the single and clamped DRWG probe geometries were analyzed in previous work; however, that research only incorporated the dominant DRWG mode. Here, that restriction is removed and the existence of evanescent higher-order modes is considered.
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Meeting (Joint with AP-S Symposium), 2015 USNC-URSI
  • Type

    conf

  • DOI
    10.1109/USNC-URSI.2015.7303317
  • Filename
    7303317