DocumentCode :
3675428
Title :
Multi-mode analysis of dual ridged waveguide systems for material characterization
Author :
Jason G. Crosby;Milo W. Hyde;Michael J. Havrilla
Author_Institution :
Air Force Institute of Technology, Wright Patterson AFB, Ohio, 45433, USA
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
33
Lastpage :
33
Abstract :
In this paper, two nondestructive dual ridged waveguide (DRWG) material characterization systems are investigated. Shown in Fig. 1, the single and clamped DRWG probe geometries were analyzed in previous work; however, that research only incorporated the dominant DRWG mode. Here, that restriction is removed and the existence of evanescent higher-order modes is considered.
Publisher :
ieee
Conference_Titel :
Radio Science Meeting (Joint with AP-S Symposium), 2015 USNC-URSI
Type :
conf
DOI :
10.1109/USNC-URSI.2015.7303317
Filename :
7303317
Link To Document :
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