Reconstruction of dielectric objects by contrast source inversion method under a limited observation

The reconstruction of dielectric objects is performed by the contrast source inversion method (CSIM) under a limited observation. The CSIM is superior to the traditional Born iterative method (BIM) or its variations because it updates the contrast source and contrast simultaneously and avoids the direct solution of forward scattering integral equation (FSIE). The CSIM is similar to the modified gradient method (MGM) but it is more computationally efficient and also requires less measurement data. This is very desirable for the reconstruction when the observation is limited or measurement condition is poor. Two numerical examples are presented to illustrate the approach and good results have been obtained.