DocumentCode :
3677907
Title :
An Approach for Test Data Generation Based on Genetic Algorithm and Delete Mutation Operators
Author :
Shweta Rani;Bharti Suri
Author_Institution :
USICT, GGS Indraprastha Univ., Delhi, India
fYear :
2015
fDate :
5/1/2015 12:00:00 AM
Firstpage :
714
Lastpage :
718
Abstract :
This paper introduces a novel method that generates the program test data based on ´Genetic Algorithm´ and ´Delete Mutation Analysis´. This approach attempts to imporve the test suite by deleting the redundant test data and leads to an efficient test data set in terms of better mutation score. In this approach, fitness is evaluated using mutation score and therefore, an adequate testdata is generated. Mutants based on delete operators are cost effective and, save huge time and effort in comparison with traditional mutant operators.
Keywords :
"Genetic algorithms","Software testing","Conferences","Software","Yttrium","Sociology"
Publisher :
ieee
Conference_Titel :
Advances in Computing and Communication Engineering (ICACCE), 2015 Second International Conference on
Print_ISBN :
978-1-4799-1733-4
Type :
conf
DOI :
10.1109/ICACCE.2015.145
Filename :
7306775
Link To Document :
بازگشت