DocumentCode
3677907
Title
An Approach for Test Data Generation Based on Genetic Algorithm and Delete Mutation Operators
Author
Shweta Rani;Bharti Suri
Author_Institution
USICT, GGS Indraprastha Univ., Delhi, India
fYear
2015
fDate
5/1/2015 12:00:00 AM
Firstpage
714
Lastpage
718
Abstract
This paper introduces a novel method that generates the program test data based on ´Genetic Algorithm´ and ´Delete Mutation Analysis´. This approach attempts to imporve the test suite by deleting the redundant test data and leads to an efficient test data set in terms of better mutation score. In this approach, fitness is evaluated using mutation score and therefore, an adequate testdata is generated. Mutants based on delete operators are cost effective and, save huge time and effort in comparison with traditional mutant operators.
Keywords
"Genetic algorithms","Software testing","Conferences","Software","Yttrium","Sociology"
Publisher
ieee
Conference_Titel
Advances in Computing and Communication Engineering (ICACCE), 2015 Second International Conference on
Print_ISBN
978-1-4799-1733-4
Type
conf
DOI
10.1109/ICACCE.2015.145
Filename
7306775
Link To Document