DocumentCode
3678391
Title
VecMeter: Measuring Vectorization on the Xeon Phi
Author
Joshua Peraza;Ananta Tiwari;William A. Ward;Roy Campbell;Laura Carrington
Author_Institution
Performance Modeling &
fYear
2015
Firstpage
478
Lastpage
481
Abstract
Wide vector units in Intel´s Xeon Phi accelerator cards can significantly boost application performance when used effectively. However, there is a lack of performance tools that provide programmers accurate information about the level of vectorization in their codes. This paper presents VecMeter, an easy-to-use tool to measure vectorization on the Xeon Phi. VecMeter utilizes binary instrumentation and therefore does not require source code modifications. This paper describes the design of VecMeter, demonstrates its accuracy, defines a metric for quantifying vectorization, and provides an example where the tool can guide code optimization to improve performance by up to 33%.
Keywords
"Radiation detectors","Hardware","Kernel","Registers","Measurement","Instruments","Context"
Publisher
ieee
Conference_Titel
Cluster Computing (CLUSTER), 2015 IEEE International Conference on
Type
conf
DOI
10.1109/CLUSTER.2015.73
Filename
7307620
Link To Document