• DocumentCode
    3678391
  • Title

    VecMeter: Measuring Vectorization on the Xeon Phi

  • Author

    Joshua Peraza;Ananta Tiwari;William A. Ward;Roy Campbell;Laura Carrington

  • Author_Institution
    Performance Modeling &
  • fYear
    2015
  • Firstpage
    478
  • Lastpage
    481
  • Abstract
    Wide vector units in Intel´s Xeon Phi accelerator cards can significantly boost application performance when used effectively. However, there is a lack of performance tools that provide programmers accurate information about the level of vectorization in their codes. This paper presents VecMeter, an easy-to-use tool to measure vectorization on the Xeon Phi. VecMeter utilizes binary instrumentation and therefore does not require source code modifications. This paper describes the design of VecMeter, demonstrates its accuracy, defines a metric for quantifying vectorization, and provides an example where the tool can guide code optimization to improve performance by up to 33%.
  • Keywords
    "Radiation detectors","Hardware","Kernel","Registers","Measurement","Instruments","Context"
  • Publisher
    ieee
  • Conference_Titel
    Cluster Computing (CLUSTER), 2015 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/CLUSTER.2015.73
  • Filename
    7307620